ESD Design, Characterization, Failure Mechanism and Testing of RF Technologies (SE45-35-0)

SynopsisIn increasingly expanding wireless communication market, high speed wired communication, disk drive, and test, there is a large demand for high performance Radio Frequency (RF) technology. With the growth of RF technologies and volume of the market, electrostatic discharge (ESD) protection is becoming increasingly important in RF technologies from RF CMOS, RF Silicon Germanium and Gallium Arsenide.

ESD protection in RF technologies is a new and emerging design and reliability field. In this area, there is a need to understand the device physics, failure mechanisms, latent mechanisms, device testing techniques, new test systems and methods, ESD characterization, circuits, circuit design, computer-aided design (CAD) methods, and software. This course will focus on both on-chip and off-chip ESD protection solutions.

What previous participants say about this course
Answers to the question 'what did you like most about the course'

• "New approaches & insights in doing circuit design with ESD knowledge" - 13 Mar 06
• "ESD RF Design techniques/ RF ESD Design Systems" - 13 Mar 06
• "Some alternative solution in design to solve ESD issue" - 13 Mar 06
• "ESD design & theory of various modeling (ESD modeling)" - 13 Mar 06
• "Have a chance to listen from the Expert and learn from his post experience. Steven is a good scientist who teach us the fundamental understanding about ESD knowledge" - 3 Aug 10
• "Prior to this, I have no knowledge whatsoever on ESD. However, the way it was presented was interesting and gave me a good idea on ESD" - 3 Aug 10
• "I've learnt that ESD protection in RF design is very much different from traditional logic circuit" - 3 Aug 10
• "The way the instructor present it, let us understand the concept from a different angle/ aspect" - 3 Aug 10

What You Will Learn

• CMOS, Silicon Germanium, and Gallium Arsenide Technology
• ESD Mechanisms and Models
• ESD Yield and Reliability Impacts
• ESD Latent Mechanisms
• ESD RF Failure Mechanisms
• ESD Design Methods
• ESD RF Characterization
• ESD Failure Criteria
• ESD Testing Techniques
• ESD Circuits
• ESD RF Circuit Design Techniques
• ESD RF Computer aided design methodologies

Who Should AttendTechnicians, engineers, circuit designers, ESD engineers, and managers involved in design, testing or reliability of analog, RF or Mixed Signal Semiconductors / circuits including:

• Design engineers
• Process engineers
• Test engineers
• Yield analysis engineers
• Product engineers
• FA engineers
• Reliability engineering
• Application engineering

PrerequisiteParticipants should have a basic background and understanding of semiconductor technologies, device physics and some circuit design basics. Previous familiarity will be advantageous in maximizing the impact of the course on the participant. Nonetheless, these concepts will be quickly reviewed as needed.

Course MethodologyThis course is presented in an interactive classroom style utilizing lecture, open discussion, and examples.

Course Duration2 days, 9 am - 5 pm

Course StructureDay 1

• RF Technology
• ESD Models and Mechanisms
• Latent Mechanisms
• Failure Mechanisms
• CMOS and ESD
• Silicon Germanium and ESD
• Gallium Arsenide and ESD

• RF ESD Design Methods
• RF ESD Characterization
• RF ESD Failure Criteria
• RF Testing Techniques
• RF ESD Circuits
• Circuit Design Techniques
• Computer Aided Design Methods